arch-beerWeekly Reading |
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Dean is presenting... Dry run: Conference Talk Talk A Scan-Island Based Design Enabling Pre-bond Testability in Die-Stacked Microprocessors Dean L. Lewis and Hsien-Hsin S. Lee Paper (GT internal only) Die stacking is a promising new technology that enables integration of devices in the third dimension. Recent research thrusts in 3D-integrated microprocessor design have demonstrated significant improvements in both power consumption and performance. However, this technology is currently being held back due to the lack of test technology. Because processor functionality is partitioned across different silicon die layers, only partial circuitry exists on each layer pre-bond. In current 3D manufacturing, layers in the die stack are simply bonded together to form the complete processor; no testing is performed at the pre-bond stage. Such a strategy leads to an exponential decay in the yield of the final product and places an economic limit on the number of die that can be stacked. To overcome this limit, pre-bond test is a necessity. In this paper, we present a technique to enable pre-bond test in each layer. Further, we address several issues with integrating this new test hardware into the final design. Finally, we use a sample 3D floorplan based on the Alpha 21264 to show that our technique can be implemented at a minimal cost (0.2% area overhead). Our design for pre-bond testability enables the structural test necessary to continue 3D integration for microprocessors beyond a few layers. |